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| 基于红外阵列的温控器膜片突跳检测装置设计 |
| Design of Temperature Controller Diaphragm Jumping Detection Device Based on Infrared Array |
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| DOI：10.16018/j.cnki.cn32-1650/n.202302009 |
| 中文关键词: 单片机 红外阵列 双金属膜片 突跳检测 |
| 英文关键词: single chip microcomputer infrared array bimetal diaphragm jump detection |
| 基金项目: |
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| 摘要点击次数: 32 |
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| 中文摘要: |
| 为了实现双金属膜片突跳动作和突跳温度的同步检测，设计了一款双金属膜片突跳检测装置。装置利用单片机控制温控仪表对双金属膜片加热并实时检测温度，同时通过红外阵列检测双金属膜片的突跳，当其发生突跳时对接收到的信号进行逻辑处理，检测突跳双金属膜片的位置与突跳温度。通过实验验证了系统的可行性、电路设计的合理性以及双金属膜片突跳动作检测的准确性。 |
| 英文摘要: |
| In order to achieve synchronous detection of bimetallic membrane jump action and jump temperature, a bimetallic membrane jump detection device is designed. The device uses single-chip microcomputer to control the temperature control instrument to heat the bimetal diaphragm and detect the temperature in real time. At the same time, the infrared array detects the jump of the bimetal diaphragm. When the jump occurs, the received signal is processed logically to detect the position and the jump temperature of the bimetal diaphragm. The feasibility of the system, the rationality of the circuit design and the accuracy of the bimetal diaphragm jump detection are verified by experiments. |
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